关键词: X射线, 稻穗, 米粒粒型, 谷粒饱满度

Abstract: Rice panicles can indicate the final rice yield and dry matter accumulation. Rice grain shape and seed plumpness are of great significance for rice genetic breeding and functional genes analysis. However, the traditional measuring method for grain shape needed threshing and peeling steps, which was inaccurate and time-consuming. And seed plumpness was measured mainly by water-deposition or wind-separation method, which could not achieve the quantitative measurement. Therefore, this paper proposed a new measuring method  to obtain the rice grain traits accurately and fast without threshing and peeling. The imaging modalities was based on X-ray to transmis image of rice panicle. Then the X-ray image was also processed to obtain the single grain image by OTSU, watershed, and labelling algorithms. After that, ellipse detection and edge extraction were applied to extract grain length, width and area. Finally 100 rice panicles were tested, and the results showed that the MAPE was 2.14% and 3.45% for grain length and width, respectively. In addition, the K-means and GMM algorithms were adopted in this study to identify the grain area and husk area. The visual distribution of rice grain filling was obtained based on the ratio of the above areas, which was able to distinguish the filled grain from unfilled grain quantitatively. In conclusion, this study provided a new effective method for measuring the complex traits of rice panicle.

Key words: X-ray, rice panicle, grain shape, filling degree